high resistance meter meaning in Chinese

高阻计

The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance , the breakdown field strength and dielectric properties were evaluated using high resistance meter , voltage resistance meter and precision impedance analyzer respectively
采用x射线衍射仪( xrd )对表面绝缘薄膜的物相组成进行了分析,扫描电子显微镜( sem )对表面绝缘薄膜的微观结构进行了研究,并用绝缘电阻测试仪、耐压测试仪和精密阻抗分析仪分别对绝缘膜进行绝缘电阻率、击穿场强和介电性能的测试。
The c - bn thin films were deposited on si substrates using the conventional radio - frequency ( rf ) sputtering system . the c - bn / si thin film heterojunctions have been fabricated with doping into n - type ( p - type ) semiconductor by implanting s ( be ) ions into them . i - v curves of bn / si heterojunctions were obtained by the high resistance meter , c - v curves of bn / si heterojunctions were obtained by the c - v meter
使用rf射频溅射系统,在si衬底上沉积氮化硼薄膜,用离子注入的方法在制备好的bn薄膜中分别注入s和be ,成功的制备了bn / sin - p和bn / sip - p薄膜异质结,用高阻仪测得bn薄膜表面电阻率和bn / si薄膜异质结的i - v曲线,用c - v仪测得bn / si薄膜异质结的c - v曲线。